DIG X-RAY PNS

An X-ray PNS AP/Lateral View Test, also known as a Paranasal Sinus X-ray, is an imaging test designed to gather diagnostic information about the bony structures at the front of the skull, particularly the paranasal sinuses. The AP lateral view, sometimes referred to as a sinus X-ray, involves the use of a small quantity of radiation directed at an angle to the chin. This test aids in assessing the paranasal sinuses and surrounding structures, helping healthcare professionals diagnose conditions such as sinus infections, blockages, or abnormalities. It is a valuable tool for obtaining detailed images of the nasal and sinus regions, assisting in the formulation of appropriate treatment plans.