DIG X-RAY BOTH HEEL LAT VIEW

The “DIG X-RAY BOTH HEEL LAT VIEW” procedure is a sophisticated diagnostic imaging method utilizing X-rays to capture a lateral view of both heels. This specialized technique is instrumental in providing in-depth insights for healthcare professionals to comprehensively evaluate the structural soundness and overall health of the heels. By scrutinizing the side profile of both heels, medical experts can meticulously examine for fractures, bone density irregularities, heel spurs, or any potential anomalies that could affect heel functionality or cause discomfort. This meticulous examination aids in a precise diagnosis, facilitating tailored treatment strategies based on the specific heel-related findings.